Side-Channel Attacks (SCA) extract cryptographic keys from hardware systems by analyzing power traces or electromagnetic emission data from the target device along with the corresponding collection of plain and/or cipher data. The traditional approach of dealing with SCA by measuring device parameters after manufacturing is expensive and time-consuming.
Fault Injection Attacks (FIA) extract secrets, e.g. cryptographic keys, from hardware systems by injecting faults, e.g. using a laser beam to disrupt the circuit function, or increasing operating frequency or supply voltage beyond their maximum specifications.
